Ultra Low Temperature Experiment System (ULTES) | System parameters |
Temperature range: 1000 milliKelvin-300 Kelvin |
Magnetic field range:0-25 Tesla |
Room temperature bore of the Magnet: f50mm |
Resistivity measurement range: 4μΩ-4MΩ |
Specific heat measurement range: <100 mJ/K |
Applications |
The system can supply extreme low temperature as low as 100 mk and physical properties at such low temperature. |
Equipments |
Physical Property Measurement System(PPMS) |
Magnetic Property Measurement System(MPMS) |
X-ray Diffractometer(XRD) |
|
High Pressure Measurement System(HPMS) | System parameters |
Temperature range 4.2K-400K |
Magnetic Field Range 0-25T/37T |
Room temperature bore of the Magnet f50mm |
Pressure range 0-10kbar/30kbar |
Resistivity measurement range 4μΩ-4MΩ |
Specifit Heat 10μW/K-100 mW/K |
Magnetic measurement range 0-10kbar, 10-4emu |
Application |
The system can supply extreme high pressure as high as 30 kbar as well as the measurement of the physical properties at such condition. |
Equipments |
Physical Property Measurement System(PPMS) |
Magnetic Property Measurement System(MPMS) |
Micro-Raman Spectroscopy |
|
STM-MFM-AFM Combo System(SMA) | System Parameters |
Temperature range: 4.2 K – 300 K |
Magnetic field: 18/20 T |
Magnet core diameter: Ø52.8 mm |
STM resolution: atomic |
STM current resolution: 12 fA |
MFM spatial resolution: 50 nm |
MFM force gradient resolution 5×10-4 N/m |
|
Vacuum: 10-9 Torr |
Applications |
The combo system SMA can characterize nearly all of the most important properties of a sample on a microscopic area. STM images the localized electronic states; MFM images the magnetic domains; AFM images the topography of a sample even on the atomic level. |
Instruments |
STM, MFM and AFM |