The SMA (STM-MFM-AFM) is a three-in-one microscope, i.e., a combo of scanning tunneling microscope, magnetic force microscope and atomic force microscope. The combo system can characterize many important properties of a sample on a microscopic area. STM images the localized electronic states; MFM images the magnetic domains; AFM images the topography of a sample even on the atomic level.

System Parameters

Temperature range: 4.2K-300K

Magnetic field range: 18/20T 

Room temperature bore of the magnet:  f 52.8mm

STM resolution: atomic

STM current resolution: 12 fA

MFM spatial resolution: 50 nm

MFM force gradient resolution 5×10-4 N/m

Vacuum: 10-9 Torr

Pressure range:  0-10kbar/30kbar

Resistivity measurement range: 4μΩ-4MΩ

Specific Heat: 10μW/K-100 mW/K

Magnetic measurement range: 0-10kbar, 10-4emu 

Application

The combo system SMA can characterize nearly all of the most important properties of a sample on a microscopic area. STM images the localized electronic states; MFM images the magnetic domains; AFM images the topography of a sample even on the atomic level.

Instruments

STM, MFM and AFM 

Go to the homepage of SMA.